国家/地区
关键词
出版物 NANOTECHNOLOGY（2）
出版时间
机构
作者 ALMEIDA CM（2）

The use of a Ga+ focused ion beam to modify graphene for device applications

NANOTECHNOLOGY

ARCHANJO BS, BARBOZA APM, NEVES BRA, MALARD LM, FERREIRA EHM, BRANT JC, ALVES ES, PLENTZ F, CAROZO V, FRAGNEAUD B, MACIEL IO, ALMEIDA CM, JORIO A, ACHETE CA

Thickness measurements of graphene oxide flakes using atomic force microscopy: results of an international interlaboratory comparison

NANOTECHNOLOGY

BU TJ, GAO HF, YAO YX, WANG JF, POLLARD AJ, LEGGE EJ, CLIFFORD CA, DELVALLEE A, DUCOURTIEUX S, LAWN MA, BABIC B, COLEMAN VA, JAMTING A, ZOU S, CHEN MH, JAKUBEK ZJ, IACOB E, CHANTHAWONG N, MONGKOLSUTTIRAT K, ZENG GH, ALMEIDA CM, HE BC, HYDE L, REN LL