国家/地区 Spain（2）
关键词 LOGIC GATE（2）
出版物 IEEE TRANSACTIONS O.（2）
出版时间
机构
作者 FEIJOO PC（2）

Experimental Observation and Modeling of the Impact of Traps on Static and Analog/HF Performance of Graphene Transistors

IEEE TRANSACTIONS ON ELECTRON DEVICES

PACHECOSANCHEZ A, MAVREDAKIS N, FEIJOO PC, WEI W, PALLECCHI E, HAPPY H, JIMENEZ D

An Extraction Method for Mobility Degradation and Contact Resistance of Graphene Transistors

IEEE TRANSACTIONS ON ELECTRON DEVICES

PACHECOSANCHEZ A, MAVREDAKIS N, FEIJOO PC, JIMENEZ D