国家/地区 China（2）
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机构 NATL INST METROL（2）
作者 GAO ST（2）

Microwave-induced combustion of graphene for further determination of elemental impurities using ICP-OES and TXRF

JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY

ZHANG AR, WANG H, ZHA PF, WANG ML, WANG HF, FAN BQ, REN DH, HAN YX, GAO ST

Histogram method for reliable thickness measurements of graphene films using atomic force microscopy (AFM)

JOURNAL OF MATERIALS SCIENCE TECHNOLOGY

YAO YX, REN LL, GAO ST, LI S