国家/地区 Korea（2） Usa（2）
关键词 AMBIENT PRESSURE XR.（2） GRAPHENE（2） WORK FUNCTION（2）
出版物 PHYSICAL CHEMISTRY .（2）
出版时间 2018（2） 2020（2）
机构 SAMSUNG ADV INST TECHNOL（4）
作者 JUNG C（4）

Elucidating the influence of residual polymer and gas environment on the electronic structure of a graphene layer using in situ APXPS

APPLIED SURFACE SCIENCE

YUN DJ, ETXEBARRIA A, LEE KJ, JUNG C, KO DS, SEOL MS, KIM HR, JEON WS, LEE E, CHUNG J, CRUMLIN EJ

Revealing unique energy level alignment at graphene/MoS(2)2-dimensional layered junction usingin situambient pressure x-ray photoelectron spectroscopy

2D MATERIALS

YUN DJ, ETXEBARRIA A, LEE KJ, SEOL M, KIM HR, JUNG C, JEON WS, LEE E, CRUMLIN EJ

Direct characterization of graphene doping state by in situ photoemission spectroscopy with Ar gas cluster ion beam sputtering (vol 20, pg 615, 2018)

PHYSICAL CHEMISTRY CHEMICAL PHYSICS

YUN DJ, KIM S, JUNG C, LEE CS, SOHN H, WON JY, KIM YS, CHUNG J, HEO S, KIM SH, SEOL M, SHIN WH

Direct characterization of graphene doping state by in situ photoemission spectroscopy with Ar gas cluster ion beam sputtering

PHYSICAL CHEMISTRY CHEMICAL PHYSICS

YUN DJ, KIM S, JUNG C, LEE CS, SOHN H, WON JY, KIM YS, CHUNG J, HEO S, KIM SH, SEOL M, SHIN WH