国家/地区 |
Sweden(3)![]() |
关键词 |
GRAPHENE(2)
RF(2)
STATISTIC(2)
WAFERSCALE FABRICAT.(2) |
出版物 | IEEE TRANSACTIONS O.(2) |
出版时间 | 2017(2) |
机构 |
KTH ROYAL INST TECHNOL(3)![]() |
作者 |
KATARIA S(3)![]() |
Wafer-Scale Statistical Analysis of Graphene FETs-Part I: Wafer-Scale Fabrication and Yield Analysis
IEEE TRANSACTIONS ON ELECTRON DEVICES
SMITH AD, WAGNER S, KATARIA S, MALM BG, LEMME MC, OSTLING M
IEEE TRANSACTIONS ON ELECTRON DEVICES
SMITH AD, WAGNER S, KATARIA S, MALM BG, LEMME MC, OSTLING M
NANOSCALE
SMITH AD, ELGAMMAL K, NIKLAUS F, DELIN A, FISCHER AC, VAZIRI S, FORSBERG F, RASANDER M, HUGOSSON H, BERGQVIST L, SCHRODER S, KATARIA S, OSTLING M, LEMME MC