国家/地区 Korea（3）
关键词
出版物
出版时间
机构 GWANGJU INST SCI TECHNOL（3）
作者 KIM JJ（3）

Quantitatively estimating defects in graphene devices using discharge current analysis method

SCIENTIFIC REPORTS

JUNG U, LEE YG, KANG CG, LEE S, KIM JJ, HWANG HJ, LIM SK, HAM MH, LEE BH

Issues with the electrical characterization of graphene devices

CARBON LETTERS

LEE BH, LEE YG, JUNG UJ, KIM YH, HWANG HJ, KIM JJ, KANG CG

Fast transient charging at the graphene/SiO2 interface causing hysteretic device characteristics

APPLIED PHYSICS LETTERS

LEE YG, KANG CG, JUNG UJ, KIM JJ, HWANG HJ, CHUNG HJ, SEO S, CHOI R, LEE BH