APPLIED SURFACE SCIENCE

GAJEWSKI K, RAMADAN S, KUNICKI P, SHAFOROST O, KLEIN N, GOTSZALK T

MICROELECTRONIC ENGINEERING

GAJEWSKI K, KUNICKI P, SIERAKOWSKI A, SZYMANSKI W, KACZOROWSKI W, NIEDZIELSKI P, RAMADAN S, SHAFOROST O, KLEIN N, HAO L, GOTSZALK T

BIOSENSORS BIOELECTRONICS

DELLE LE, PACHAURI V, SHARMA S, SHAFOROST O, MA H, ADABI M, LILISCHKIS R, WAGNER P, THOELEN R, KLEIN N, O KENNEDY R, INGEBRANDT S

SURFACE TOPOGRAPHYMETROLOGY PROPERTIES

WANG R, PEARCE R, GALLOP J, PATEL T, ZHAO F, POLLARD A, KLEIN N, JACKMAN R, ZURUTUZA A, HAO L

DIAMOND RELATED MATERIALS

GAJEWSKI K, GONISZEWSKI S, SZUMSKA A, MOCZALA M, KUNICKI P, GALLOP J, KLEIN N, HAO L, GOTSZALK T

IET CIRCUITS DEVICES SYSTEMS

GONISZEWSKI S, GALLOP J, ADABI M, GAJEWSKI K, SHAFOROST O, KLEIN N, SIERAKOWSKI A, CHEN J, CHEN YF, GOTSZALK T, HAO L

2D MATERIALS

NOORI YJ, THOMAS S, RAMADAN S, GREENACRE VK, ABDELAZIM NM, HAN Y, ZHANG J, BEANLAND R, HECTOR AL, KLEIN N, REID G, BARTLETT PN, DE GROOT CH

ACS APPLIED ELECTRONIC MATERIALS

WANG YX, GUERENNEUR A, RAMADAN S, HUANG JL, FEARN S, NABI N, KLEIN N, ALFORD NM, PETROV PK

ACS APPLIED MATERIALS INTERFACES

RAMADAN S, LOBO R, ZHANG YZ, XU LZ, SHAFOROST O, TSANG DKH, FENG JY, YIN TY, QIAO M, RAJESHIRKE A, JIAO LR, PETROV PK, DUNLOP IE, TITIRICI MM, KLEIN N