ACS APPLIED MATERIALS INTERFACES

PAKDEHI DM, APROJANZ J, SINTERHAUF A, PIERZ K, KRUSKOPF M, WILLKE P, BARINGHAUS J, STOCKMANN JP, TRAEGER GA, HOHLS F, TEGENKAMP C, WENDEROTH M, AHLERS FJ, SCHUMACHER HW

PHYSICAL REVIEW B

SCHURR J, KALMBACH CC, AHLERS FJ, HOHLS F, KRUSKOPF M, MULLER A, PIERZ K, BERGSTEN T, HAUG RJ

2D MATERIALS

KRUSKOPF M, PAKDEHI DM, PIERZ K, WUNDRACK S, STOSCH R, DZIOMBA T, GOTZ M, BARINGHAUS J, APROJANZ J, TEGENKAMP C, LIDZBA J, SEYLLER T, HOHLS F, AHLERS FJ, SCHUMACHER HW

PHYSICAL REVIEW B

KALMBACH CC, AHLERS FJ, SCHURR J, MULLER A, FEILHAUER J, KRUSKOPF M, PIERZ K, HOHLS F, HAUG RJ

JOURNAL OF PHYSICSCONDENSED MATTER

KRUSKOPF M, PIERZ K, WUNDRACK S, STOSCH R, DZIOMBA T, KALMBACH CC, MULLER A, BARINGHAUS J, TEGENKAMP C, AHLERS FJ, SCHUMACHER HW

IEEE TRANSACTIONS ON ELECTRON DEVICES

KRUSKOPF M, BAUER S, PIMSUT Y, CHATTERJEE A, PATEL DK, RIGOSI AF, ELMQUIST RE, PIERZ K, PESEL E, GOTZ M, SCHURR J

ACS APPLIED ELECTRONIC MATERIALS

CHATTERJEE A, KRUSKOPF M, WUNDRACK S, HINZE P, PIERZ K, STOSCH R, SCHERER H

MEASUREMENT SCIENCE TECHNOLOGY

BAUER S, BEHR R, ELMQUIST RE, GOTZ M, HERICK J, KIELER O, KRUSKOPF M, LEE J, PALAFOX L, PIMSUT Y, SCHURR J