国家/地区 Austria（2）
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作者 OSTLING M（2）

Bias-temperature instability in single-layer graphene field-effect transistors

APPLIED PHYSICS LETTERS

ILLARIONOV YY, SMITH AD, VAZIRI S, OSTLING M, MUELLER T, LEMME MC, GRASSER T

Hot-Carrier Degradation and Bias-Temperature Instability in Single-Layer Graphene Field-Effect Transistors: Similarities and Differences

IEEE TRANSACTIONS ON ELECTRON DEVICES

ILLARIONOV Y, SMITH A, VAZIRI S, OSTLING M, MUELLER T, LEMME M, GRASSER T