国家/地区
关键词
出版物
出版时间 2009（2）
机构
作者 SCHMID AK（2）

Three-fold diffraction symmetry in epitaxial graphene and the SiC substrate

PHYSICAL REVIEW B

SIEGEL DA, ZHOU SY, EL GABALY F, SCHMID AK, MCCARTY KF, LANZARA A

Towards wafer-size graphene layers by atmospheric pressure graphitization of silicon carbide

NATURE MATERIALS

EMTSEV KV, BOSTWICK A, HORN K, JOBST J, KELLOGG GL, LEY L, MCCHESNEY JL, OHTA T, RESHANOV SA, ROHRL J, ROTENBERG E, SCHMID AK, WALDMANN D, WEBER HB, SEYLLER T