国家/地区 Arabia（2）
关键词 ELLIPSOMETRY（2）
出版物
出版时间 2016（2）
机构 KING ABDULAZ.（2）
作者 SHOKR FS（2）

Raman and ellipsometry spectroscopic analysis of graphene films grown directly on Si substrate via CVD technique for estimating the graphene atomic planes number

JOURNAL OF MOLECULAR STRUCTURE

ALHAZMI FS, BEALL GW, ALGHAMDI AA, ALSHAHRIE A, SHOKR FS, MAHMOUD WE

Structure and spectroscopic analysis of the graphene monolayer film directly grown on the quartz substrate via the HF-CVD technique

SUPERLATTICES MICROSTRUCTURES

MAHMOUD WE, ALHAZMI FS, ALGHAMDI AA, SHOKR FS, BEALL GW, BRONSTEIN LM