国家/地区 China（3）
关键词 DEFECT（3）
出版物
出版时间
机构 SOOCHOW UNIV（2）
作者 WANG CH（3）

Origin of microstructural defects in single-crystalline films van der Waals epitaxy on graphene

JOURNAL OF CRYSTAL GROWTH

LIU Y, XU Y, CAO B, LI ZY, ZHAO E, YANG S, WANG CH, WANG JF, XU K

Raman spectra investigation of the defects of chemical vapor deposited multilayer graphene and modified by oxygen plasma treatment

SUPERLATTICES MICROSTRUCTURES

LI ZY, XU Y, CAO B, QI L, HE SY, WANG CH, ZHANG JC, WANG JF, XU K

Microstructural and optical properties of stress-free GaN films on graphene prepared by PECVD

JAPANESE JOURNAL OF APPLIED PHYSICS

XU LY, XU Y, LUO AL, ZHOU H, CAO B, WANG CH, XU K