SURFACE TOPOGRAPHYMETROLOGY PROPERTIES

WANG JC, YAN H, TIAN S, PU JB, LU GM, REN LC, LIU ZX, FAN XQ, WANG LP

APPLIED THERMAL ENGINEERING

YANG HG, YILMAZ G, HAN G, ERITEN M, ZHANG Z, YU SR, SHI MN, YAN H, YANG WM, XIE PC, TURNG LS

APPLIED SURFACE SCIENCE

LI JF, ZHAO C, LIU BY, YOU CY, CHU FH, TIAN N, CHEN YF, LI SY, AN BX, CUI AJ, ZHANG XP, YAN H, LIU DM, ZHANG YZ

2D MATERIALS

DENG WJ, CHEN YF, YOU CY, AN BX, LIU BY, LI SY, ZHANG YZ, YAN H, SUN L

ACS SUSTAINABLE CHEMISTRY ENGINEERING

YAN H, YAO W, FAN RZ, ZHANG Y, LUO JH, XU JG

ADVANCED ELECTRONIC MATERIALS

DENG WJ, CHEN YF, YOU CY, LIU BY, YANG YH, SHEN GL, LI SY, SUN L, ZHANG YZ, YAN H

CRYSTALS

YAN H, KU PC, GAN ZY, LIU S, LI P

NANO LETTERS

YAN H, NARASIMHA KT, DENLINGER J, LI FH, MO SK, HOHMAN JN, DAHL JEP, CARLSON RMK, TKACHENKO BA, FOKIN AA, SCHREINER PR, HUSSAIN Z, SHEN ZX, MELOSH NA

ADVANCED MATERIALS

GENG DC, MENG L, CHEN BY, GAO EL, YAN W, YAN H, LUO BR, XU J, WANG HP, MAO ZP, XU ZP, HE L, ZHANG ZY, PENG LM, YU G

ELECTROCHIMICA ACTA

DENG SX, SUN D, WU CH, WANG H, LIU JB, SUN YX, YAN H