国家/地区 | China(2) Germany(2) |
关键词 | AMORPHOUS SILICON(6) |
出版物 | |
出版时间 | 2016(2) 2018(2) |
机构 | |
作者 |
ALBERT M(2)
CHAVARIN CA(2)
STROBEL C(2)
WENGER C(2)
|
MICROELECTRONICS RELIABILITY
ZHANG QW, LI P, LIAO YB, WANG G, ZENG RZ, WANG H
MATERIALS
CHAVARIN CA, STROBEL C, KITZMANN J, DI BARTOLOMEO A, LUKOSIUS M, ALBERT M, BARTHA JW, WENGER C
JOURNAL OF PHYSICSCONDENSED MATTER
AREZKI H, BOUTCHICH M, ALAMARGUY D, MADOURI A, ALVAREZ J, CABARROCAS PRI, KLEIDER JP, YAO F, LEE YH
ELECTROCHIMICA ACTA
SUN W, HU RZ, LIU H, ZHANG HY, LIU JW, YANG LC, WANG HH, ZHU M
ACS NANO
JUNG JW, RYU WH, SHIN J, PARK K, KIM ID
ACS APPLIED ELECTRONIC MATERIALS
STROBEL C, CHAVARIN CA, VOLKEL S, JAHN A, HIESS A, KNAUT M, ALBERT M, WENGER C, STEINKE O, STEPHAN U, ROHLECKE S, MIKOLAJICK T