国家/地区 | Japan(4) |
关键词 | CONDUCTIVE ATOMIC FORCE MICROSCOPY(4) |
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ACS APPLIED MATERIALS INTERFACES
MATSUMOTO Y, KOINUMA M, KIM SY, WATANABE Y, TANIGUCHI T, HATAKEYAMA K, TATEISHI H, IDA S
ADVANCED MATERIALS INTERFACES
CERMAK J, YAMADA T, GANZEROVA K, REZEK B
JAPANESE JOURNAL OF APPLIED PHYSICS
HIROTOMI Y, KUBOTA W, UTSUNOMIYA T, ICHII T, SUGIMURA H
APPLIED SURFACE SCIENCE
MORIKUNI Y, DE SILVA KKH, VISWANATH P, HARA M, YOSHIMURA M