MICROELECTRONICS RELIABILITY

CUI TF, LI Q, XUAN YM, ZHANG P

PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA

LV RT, CHEN GG, LI Q, MCCREARY A, BOTELLOMENDEZ A, MOROZOV SV, LIANG LB, DECLERCK X, PEREALOPEZ N, CULLENI DA, FENG SM, ELIAS AL, CRUZSILVA R, FUJISAWA K, ENDO M, KANG FY, CHARLIER JC, MEUNIER V, PAN MH, HARUTYUNYAN AR, NOVOSELOV KS, TERRONES M

INTERNATIONAL JOURNAL OF ELECTROCHEMICAL SCIENCE

WU SW, HUANG XL, WU YH, LUO LP, JIN YC, LI Q

MATERIALS TECHNOLOGY

LI RQ, LI Q, ZHOU Y, CHEN KP, ZHANG CX, CHEN L, GAO L, CUI JJ

ADVANCED ENERGY MATERIALS

LI Q, LI X, WAGEH S, ALGHAMDI AA, YU JG

JOURNAL OF POWER SOURCES

HUANG Y, LIU H, LU YC, HOU YL, LI Q

PETROLEUM SCIENCE TECHNOLOGY

XING X, WANG X, PAN H, YUAN L, LI Q, ZHANG M, YANG J