国家/地区 | Sweden(3) |
关键词 | GRAPHENE(3) |
出版物 | IEEE TRANSACTIONS O.(2) |
出版时间 | 2017(3) |
机构 | KTH ROYAL INST TECHNOL(3) |
作者 | SMITH AD(3) |
Wafer-Scale Statistical Analysis of Graphene FETs-Part I: Wafer-Scale Fabrication and Yield Analysis
IEEE TRANSACTIONS ON ELECTRON DEVICES
SMITH AD, WAGNER S, KATARIA S, MALM BG, LEMME MC, OSTLING M
IEEE TRANSACTIONS ON ELECTRON DEVICES
SMITH AD, WAGNER S, KATARIA S, MALM BG, LEMME MC, OSTLING M
SURFACE SCIENCE
ELGAMMAL K, HUGOSSON HW, SMITH AD, RASANDER M, BERGQVIST L, DELIN A