NANO LETTERS

DAI JY, WANG DX, ZHANG M, NIU TC, LI A, YE M, QIAO S, DING GQ, XIE XM, WANG YQ, CHU PK, YUAN QH, DI ZF, WANG X, DING F, YAKOBSON BI

IEEE TRANSACTIONS ON DEVICE MATERIALS RELIABILITY

LI C, CHEN Q, NG J, ZHANG FL, WANG H, DI MF, PAN ZJ, WU TR, ZHANG K, XIE XM, XIE YH, WANG AL