国家/地区 | Sweden(2) |
关键词 | GRAPHENE(2) |
出版物 | IEEE TRANSACTIONS O.(2) |
出版时间 | 2017(2) |
机构 | KTH ROYAL INST TECHNOL(2) |
作者 | MALM BG(2) |
Wafer-Scale Statistical Analysis of Graphene FETs-Part I: Wafer-Scale Fabrication and Yield Analysis
IEEE TRANSACTIONS ON ELECTRON DEVICES
SMITH AD, WAGNER S, KATARIA S, MALM BG, LEMME MC, OSTLING M
IEEE TRANSACTIONS ON ELECTRON DEVICES
SMITH AD, WAGNER S, KATARIA S, MALM BG, LEMME MC, OSTLING M