国家/地区 | Sweden(11) |
关键词 | GRAPHENE(11) |
出版物 | IEEE TRANSACTIONS O.(3) NANO LETTERS(3) |
出版时间 | 2013(5) 2017(2) 2019(2) |
机构 | KTH ROYAL INST TECHNOL(11) |
作者 | OSTLING M(11) |
NANO LETTERS
FAN XG, FORSBERG F, SMITH AD, SCHRODER S, WAGNER S, OSTLING M, LEMME MC, NIKLAUS F
ACS APPLIED ENERGY MATERIALS
DELEKTA SS, OSTLING M, LI JT
ACS APPLIED MATERIALS INTERFACES
QUELLMALZ A, SMITH AD, ELGAMMAL K, FAN XG, DELIN A, OSTLING M, LEMME M, GYLFASON KB, NIKLAUS F
IEEE TRANSACTIONS ON ELECTRON DEVICES
RODRIGUEZ S, VAZIRI S, SMITH A, FREGONESE S, OSTLING M, LEMME MC, RUSU A
SOLIDSTATE ELECTRONICS
SMITH AD, VAZIRI S, NIKLAUS F, FISCHER AC, STERNER M, DELIN A, OSTLING M, LEMME MC
ADVANCED MATERIALS
LI JT, YE F, VAZIRI S, MUHAMMED M, LEMME MC, OSTLING M
NANO LETTERS
SMITH AD, NIKLAUS F, PAUSSA A, VAZIRI S, FISCHER AC, STERNER M, FORSBERG F, DELIN A, ESSENI D, PALESTRI P, OSTLING M, LEMME MC
NANO LETTERS
VAZIRI S, LUPINA G, HENKEL C, SMITH AD, OSTLING M, DABROWSKI J, LIPPERT G, MEHR W, LEMME MC
CRYSTALS
LI JT, OSTLING M
Wafer-Scale Statistical Analysis of Graphene FETs-Part I: Wafer-Scale Fabrication and Yield Analysis
IEEE TRANSACTIONS ON ELECTRON DEVICES
SMITH AD, WAGNER S, KATARIA S, MALM BG, LEMME MC, OSTLING M