国家/地区
关键词 HRTEM（2）
出版物
出版时间 2010（2）
机构
作者

Simulation Study of Aberration-Corrected High-Resolution Transmission Electron Microscopy Imaging of Few-Layer-Graphene Stacking

MICROSCOPY MICROANALYSIS

NELSON F, DIEBOLD AC, HULL R

Examining Co-Based Nanocrystals on Graphene Using Low-Voltage Aberration-Corrected Transmission Electron Microscopy

ACS NANO

WARNER JH, RUMMELI MH, BACHMATIUK A, WILSON M, BUCHNER B