国家/地区 |
Sweden(2)![]() |
关键词 |
RF(2)![]() |
出版物 | IEEE TRANSACTIONS O.(2) |
出版时间 |
2017(2)![]() |
机构 | KTH ROYAL IN.(2) |
作者 |
KATARIA S(2)
LEMME MC(2)
MALM BG(2)
OSTLING M(2)
SMITH AD(2) WAGNER S(2) |
Wafer-Scale Statistical Analysis of Graphene FETs-Part I: Wafer-Scale Fabrication and Yield Analysis
IEEE TRANSACTIONS ON ELECTRON DEVICES
SMITH AD, WAGNER S, KATARIA S, MALM BG, LEMME MC, OSTLING M
IEEE TRANSACTIONS ON ELECTRON DEVICES
SMITH AD, WAGNER S, KATARIA S, MALM BG, LEMME MC, OSTLING M