国家/地区 | China(3) |
关键词 | SCANNING ELECTRON MICROSCOPY(10) |
出版物 | IEEE ELECTRON DEVIC.(2) |
出版时间 | 2022(10) |
机构 | |
作者 | CHEN XP(2) YU JB(2) YUAN M(2) |
NANOMATERIALS
ROSHCHUPKIN D, KONONENKO O, FAKHRTDINOV R, EMELIN E, SERGEEV A
IEEE ELECTRON DEVICE LETTERS
YUAN M, YU JB, CHEN XP
MATERIALS
AIMAGANBETOV K, ALMAS N, KURBANOVA B, MURATOV D, SERIKKANOV A, INSEPOV Z, TOKMOLDIN N
MICROSCOPY
SASAKI Y, HIRAYAMA S, NAKAO R
IEEE ELECTRON DEVICE LETTERS
YUAN M, LUO F, RAO YF, YING W, YU JB, LI H, CHEN XP
DENTAL MATERIALS
RADUNOVIC M, PAVIC A, IVANOVIC V, MILIVOJEVIC M, RADOVIC I, DI CARLO R, PILATO S, FONTANA A, PIATTELLI A, PETROVIC S
CONSTRUCTION BUILDING MATERIALS
ALEX AG, KEDIR A, TEWELE TG
SURFACE INTERFACE ANALYSIS
ZHANG K, BAN CG, YUAN Y, HUANG L, GAN Y
JOURNAL OF THE EUROPEAN CERAMIC SOCIETY
MUNOZFERREIRO C, LOPEZPERNIA C, MORICHE R, GOMMERINGER A, KERN F, POYATO R, GALLARDOLOPEZ A
JOURNAL OF FUNCTIONAL BIOMATERIALS
VIMALANATHAN B, VIJAYA JJ, MARY BCJ, IGNACIMUTHU S, DANIEL M, JAYAVEL R, BOUOUDINA M, BELLUCCI S