国家/地区 Japan（3）
关键词 SCANNING PROBE MICROSCOPY（3）
出版物
出版时间
机构
作者

Rearrangement of pi-Electron Network and Switching of Edge-Localized pi State in Reduced Graphene Oxide

ACS NANO

FUJII S, ENOKI T

Formation of wide and atomically flat graphene layers on ultraprecision-figured 4H-SiC(0001) surfaces

SURFACE SCIENCE

HATTORI AN, OKAMOTO T, SADAKUNI S, MURATA J, ARIMA K, SANO Y, HATTORI K, DAIMON H, ENDO K, YAMAUCHI K

Rapid and Direct Conversion of Graphite Crystals into High-Yielding, Good-Quality Graphene by Supercritical Fluid Exfoliation

CHEMISTRYA EUROPEAN JOURNAL

RANGAPPA D, SONE K, WANG MS, GAUTAM UK, GOLBERG D, ITOH H, ICHIHARA M, HONMA I