国家/地区
关键词 SCANNING PROBE MICROSCOPY（2）
出版物 APPLIED PHYSICS LETTERS（2）
出版时间
机构
作者

Scanning gate microscopy of current-annealed single layer graphene

APPLIED PHYSICS LETTERS

CONNOLLY MR, CHIOU KL, SMITH CG, ANDERSON D, JONES GAC, LOMBARDO A, FASOLI A, FERRARI AC

Charging and discharging of graphene in ambient conditions studied with scanning probe microscopy

APPLIED PHYSICS LETTERS

VERDAGUER A, CARDELLACH M, SEGURA JJ, SACHA GM, MOSER J, ZDROJEK M, BACHTOLD A, FRAXEDAS J