国家/地区 India（2）
关键词 XRAY DIFFRACTION（2）
出版物
出版时间
机构
作者 SAINI P（2）

Determination of defect density, crystallite size and number of graphene layers in graphene analogues using X-ray diffraction and Raman spectroscopy

INDIAN JOURNAL OF PURE APPLIED PHYSICS

SHARMA R, CHADHA N, SAINI P

A new insight into the structural modulation of graphene oxide upon chemical reduction probed by Raman spectroscopy and X-ray diffraction

CARBON LETTERS

CHADHA N, SHARMA R, SAINI P