国家/地区 Japan（4）
关键词 XRAY DIFFRACTION（4）
出版物
出版时间 2020（2）
机构
作者 SASAKI T（2） TAKAHASI M（2）

X-ray in situ observation of graphene precipitating directly on sapphire substrate with and without Ti capping layer

JOURNAL OF CRYSTAL GROWTH

NARITSUKA S, YAMADA J, UEDA Y, NAKASHIMA A, KASHIO T, MARUYAMA T, FUJIKAWA S, SASAKI T, TAKAHASI M

In-situ X-ray diffraction analysis of GaN growth on graphene-covered amorphous substrates

JAPANESE JOURNAL OF APPLIED PHYSICS

FUKE S, SASAKI T, TAKAHASI M, HIBINO H

Determination of non-uniform graphene thickness on SiC (0001) by X-ray diffraction

APPLIED SURFACE SCIENCE

RUAMMAITREE A, NAKAHARA H, AKIMOTO K, SODA K, SAITO Y

Preparation of highly crystalline nanofibers on Fe and Fe-Ni catalysts with a variety of graphene plane alignments

CARBON

TANAKA A, YOON SH, MOCHIDA I