国家/地区 China（3）
关键词 FOURPROBE MEASUREMENT（3）
出版物
出版时间 2017（2）
机构 CHINESE ACAD.（2）
作者 YAN JH（3）

Direct probing of imperfection-induced electrical degradation in millimeter-scale graphene on SiO2 substrates

2D MATERIALS

MA RS, MA JJ, YAN JH, WU LM, LIU HT, GUO W, WANG S, HUAN Q, LIN X, BAO LH, PANTELIDES ST, GAO HJ

Direct Four-Probe Measurement of Grain-Boundary Resistivity and Mobility in Millimeter-Sized Graphene

NANO LETTERS

MA RS, HUAN Q, WU LM, YAN JH, GUO W, ZHANG YY, WANG S, BAO LH, LIU YQ, DU SX, PANTELIDES ST, GAO HJ

Direct measurements of conductivity and mobility in millimeter-sized single-crystalline graphene via van der Pauw geometry

CHINESE PHYSICS B

MA RS, HUAN Q, WU LM, YAN JH, ZHANG YY, BAO LH, LIU YQ, DU SX, GAO HJ