国家/地区 China（2）
关键词
出版物 ADVANCED ELECTRONIC MATERIALS（2）
出版时间 2016（2）
机构 CHINESE ACAD SCI（2）
作者

An Effective Approach for the Identification of Carrier Type and Local Inversion Doping in Graphene by Biased Atomic Force Microscopy

ADVANCED ELECTRONIC MATERIALS

JIA YP, GUO LW, LI ZL, HUANG J, LU W, CHEN HX, CHEN XL

Improving the Charge Injection in Organic Transistors by Covalently Linked Graphene Oxide/Metal Electrodes

ADVANCED ELECTRONIC MATERIALS

CHEN XS, ZHANG SN, WU KJ, XU ZY, LI HW, MENG YC, MA XM, LIU LW, LI LQ