国家/地区 India（3）
关键词 RAMAN SPECTROSCOPY（3）
出版物
出版时间
机构
作者 SHARMA R（3）

THE ROLE OF PRESSURE TO QUANTIFY THE DEFECTS AND ITS EFFECT ON THE MORPHOLOGY OF GRAPHENE LAYERS

SURFACE REVIEW LETTERS

AMIT K, SHARMA R

Determination of defect density, crystallite size and number of graphene layers in graphene analogues using X-ray diffraction and Raman spectroscopy

INDIAN JOURNAL OF PURE APPLIED PHYSICS

SHARMA R, CHADHA N, SAINI P

A new insight into the structural modulation of graphene oxide upon chemical reduction probed by Raman spectroscopy and X-ray diffraction

CARBON LETTERS

CHADHA N, SHARMA R, SAINI P