国家/地区 Japan（3）
关键词
出版物 MICROSCOPY MICROANA.（2）
出版时间 2009（2）
机构 TOKYO INST T.（2）
作者 ABE Y（3）

Adatom on Graphene, Directly Imaged by Aberration Corrected TEM at 300kV

MICROSCOPY MICROANALYSIS

TANAKA T, ABE Y, SAWADA H, OKUNISHI E, KONDO Y, TANISHIRO Y, TAKAYANAGI K

Electron Energy Loss Spectroscopy of Graphene Identified by Aberration Corrected TEM at 300kV

MICROSCOPY MICROANALYSIS

ABE Y, TANAKA T, SAWADA H, OKUNISHI E, KONDO Y, TANISHIRO Y, TAKAYANAGI K

Graphene electric field sensor for large scale lightning detection network

AIP ADVANCES

KAREEKUNNAN A, AGARI T, KUDO T, NIWA S, ABE Y, MARUYAMA T, MIZUTA H, MURUGANATHAN M