国家/地区 Japan（3）
关键词
出版物
出版时间
机构 JEOL LTD（3）
作者 SAWADA H（2） SUENAGA K（2）

Determination of absolute number of graphene layers on nickel substrate with scanning Auger microprobe

APPLIED PHYSICS EXPRESS

SHIMA M, KATO H, SHIHOMMATSU K, HOMMA Y

Depth sensitive imaging of graphene with an atomic resolution microscope

APPLIED PHYSICS LETTERS

MORISHITA S, SENGA R, LIN YC, KATO R, SAWADA H, SUENAGA K

Atomic-Resolution STEM Imaging of Graphene at Low Voltage of 30 kV with Resolution Enhancement by Using Large Convergence Angle

PHYSICAL REVIEW LETTERS

SAWADA H, SASAKI T, HOSOKAWA F, SUENAGA K