国家/地区 Korea（3）
关键词 ATOMIC FORCE MICROSCOPY（3）
出版物 JOURNAL OF NANOSCIE.（2）
出版时间 2016（3）
机构
作者

Nanoscale Direct Mapping of Noise Source Activities on Graphene Domains

ACS NANO

LEE H, CHO D, SHEKHAR S, KIM J, PARK J, HONG BH, HONG S

Molecular Dynamics Study of the Interfacial Structure of Water and Graphene: Density and Pressure Profile Analysis

JOURNAL OF NANOSCIENCE NANOTECHNOLOGY

YOON HM, LEE JS, LEE JS

Quantitative Assessment of Friction Characteristics of Single-Layer MoS2 and Graphene Using Atomic Force Microscopy

JOURNAL OF NANOSCIENCE NANOTECHNOLOGY

KHAC BCT, CHUNG KH