PHYSICAL REVIEW B
RZESZOTARSKI B, MRENCAKOLASINSKA A, SZAFRAN B
POLISH JOURNAL OF CHEMICAL TECHNOLOGY
FRYCZKOWSKA B, WIECHNIAK K
OPTICAL MATERIALS
DUSZA M, GRANEK F, STREK W
METROLOGY MEASUREMENT SYSTEMS
MLECZKO K, PTAK P, ZAWISLAK Z, SLOMA M, JAKUBOWSKA M, KOLEK A
APPLIED SURFACE SCIENCE
LUKASZKOWICZ K, SZINDLER M, DRYGALA A, DOBRZANSKI LA, PROKOPOWICZ MPV, PASTERNAK I, PRZEWLOKA A, SZINDLER MM, DOMANSKI M
MATERIALS CHEMISTRY PHYSICS
MAZDZIARZ M, MROZEK A, KUS W, BURCZYNSKI T
SYNTHETIC METALS
OLSZOWSKA K, PANG JB, WROBEL PS, ZHAO L, TA HQ, LIU ZF, TRZEBICKA B, BACHMATIUK A, RUMMELI MH
Statistical analysis of the reduction process of graphene oxide probed by Raman spectroscopy mapping
JOURNAL OF PHYSICSCONDENSED MATTER
WROBLEWSKA A, DUZYNSKA A, JUDEK J, STOBINSKI L, ZERANSKA K, GERTYCH AP, ZDROJEK M
ACTA CRYSTALLOGRAPHICA SECTION CSTRUCTURAL CHEMISTRY
MILASHIUS V, PAVLYUK V, KLUZIAK K, DMYTRIV G, EHRENBERG H
APPLIED PHYSICS AMATERIALS SCIENCE PROCESSING
CISZEWSKI M, BENKE G, LESZCZYNSKASEJDA K, KOPYTO D