MICROMACHINES

FERNANDEZ S, BOSCA A, PEDROS J, INES A, FERNANDEZ M, ARNEDO I, GONZALEZ JP, DE LA CRUZ M, SANZ D, MOLINERO A, FANDAN RS, PAMPILLON MA, CALLE F, GANDIA JJ, CARABE J, MARTINEZ J

IEEE ACCESS

HADARIG AI, VER HOEYE S, FERNANDEZ M, VAZQUEZ C, ALONSO L, LASHERAS F

IEEE ACCESS

HADARIG AI, VER HOEYE S, FERNANDEZ M, MIKHAILOV S, VAZQUEZ C, ALONSO L, LASHERAS F

IEEE ACCESS

HOEYE SV, HADARIG A, VAZQUEZ C, FERNANDEZ M, ALONSO L, HERAS FL

2D MATERIALS

MARCHENA M, WAGNER F, ARLIGUIE T, ZHU B, JOHNSON B, FERNANDEZ M, CHEN TL, CHANG T, LEE R, PRUNERI V, MAZUMDER P

IEEE ACCESS

VER HOEYE S, FERNANDEZ M, VAZQUEZ C, HADARIG AI, CAMBLOR R, ALONSO L, LASHERAS F

POLYMER TESTING

LANDA M, CANALES J, FERNANDEZ M, MUNOZ ME, SANTAMARIA A

PROGRESS IN ELECTROMAGNETICS RESEARCHPIER

HOTOPAN G, HOEYE SV, VAZQUEZ C, HADARIG A, CAMBLOR R, FERNANDEZ M, HERAS FL

JOURNAL OF ELECTROMAGNETIC WAVES APPLICATIONS

CAMBLOR R, HOEYE SV, HOTOPAN G, VAZQUEZ C, FERNANDEZ M, HERAS FL, ALVAREZ P, MENENDEZ R

PROGRESS IN ELECTROMAGNETICS RESEARCHPIER

HOTOPAN G, HOEYE SV, VAZQUEZ C, CAMBLOR R, FERNANDEZ M, HERAS FL, ALVAREZ P, MENENDEZ R