| 国家/地区 |
Sweden(4)
|
| 关键词 |
GRAPHENE(3)
RF(2)
STATISTIC(2)
WAFERSCALE FABRICAT.(2) |
| 出版物 | IEEE TRANSACTIONS O.(2) |
| 出版时间 |
2017(4)
|
| 机构 | KTH ROYAL IN.(4) |
| 作者 |
SMITH AD(4)
|
Wafer-Scale Statistical Analysis of Graphene FETs-Part I: Wafer-Scale Fabrication and Yield Analysis
IEEE TRANSACTIONS ON ELECTRON DEVICES
SMITH AD, WAGNER S, KATARIA S, MALM BG, LEMME MC, OSTLING M
IEEE TRANSACTIONS ON ELECTRON DEVICES
SMITH AD, WAGNER S, KATARIA S, MALM BG, LEMME MC, OSTLING M
SURFACE SCIENCE
ELGAMMAL K, HUGOSSON HW, SMITH AD, RASANDER M, BERGQVIST L, DELIN A
NANOSCALE
DELEKTA SS, SMITH AD, LI JT, OSTLING M
