国家/地区 Usa（3）
关键词 ATOMIC FORCE MICROSCOPY（3）
出版物
出版时间 2014（3）
机构
作者

van der Waals Screening by Single-Layer Graphene and Molybdenum Disulfide

ACS NANO

TSOI S, DEV P, FRIEDMAN AL, STINE R, ROBINSON JT, REINECKE TL, SHEEHAN PE

Secondary Electron Intensity Contrast Imaging and Friction Properties of Micromechanically Cleaved Graphene Layers on Insulating Substrates

JOURNAL OF ELECTRONIC MATERIALS

GUPTA S, HEINTZMAN E, JASINSKI J

Graphene Nanopore Support System for Simultaneous High-Resolution AFM Imaging and Conductance Measurements

ACS APPLIED MATERIALS INTERFACES

CONNELLY LS, MECKES B, LARKIN J, GILLMAN AL, WANUNU M, LAL R