国家/地区 Usa(52)
关键词 GRAPHENE(10) BILAYER EDGE(2) DENSITY FUNCTIONAL .(2)
ELECTRON MICROSCOPY(2) IN SITU ELECTRON MI.(2) LOWENERGY ELECTRON .(2)
RAMAN SPECTROSCOPY(2) SCANNING TUNNELLING.(2)
出版物 PHYSICAL REVIEW B(9) NEW JOURNAL OF PHYS.(5) ACS NANO(4)
APPLIED PHYSICS LET.(4) JOURNAL OF PHYSICAL.(4) SCIENTIFIC REPORTS(3)
CARBON(2) ELECTROANALYSIS(2) OPTICS EXPRESS(2)
出版时间 2012(9) 2009(8) 2011(6) 2010(5) 2014(5) 2017(4) 2008(3) 2015(3) 2013(2) 2016(2) 2018(2) 2020(2)
机构 SANDIA NATL LABS(52)
作者 BEECHEM TE(15) BARTELT NC(13) MCCARTY KF(13) HOWELL SW(10)
OHTA T(10) FEIBELMAN PJ(7) NIE S(7) RUIZ I(7)
GOLDFLAM MD(6) LAMBERT TN(6) WHEELER DR(6) HUANG JY(5)
LI J(5) STARODUB E(5) BOSTWICK A(4) BURCKEL DB(4)
LOGINOVA E(4) PETERS DW(4) POLSKY R(4) ROTENBERG E(4)

PHYSICAL REVIEW APPLIED

JARZEMBSKI A, GOLDFLAM M, SIDDIQUI A, RUIZ I, BEECHEM TE

APPLIED PHYSICS LETTERS

GOLDFLAM MD, RUIZ I, HOWELL SW, TAUKEPEDRETTI A, ANDERSON EM, WENDT JR, FINNEGAN P, HAWKINS S, COON W, FORTUNE TR, SHANER EA, KADLEC C, OLESBERG JT, KLEM J, WEBSTER PT, SINCLAIR MB, KIM JK, PETERS DW, BEECHEM TE

ACS APPLIED NANO MATERIALS

RUIZ I, BEECHEM TE, SMITH S, DICKENS P, PAISLEY EA, SHANK J, HOWELL SW, SARMA R, DRAPER BL, GOLDFLAM MD

OPTICS EXPRESS

GOLDFLAM MD, RUIZ I, HOWELL SW, WENDT JR, SINCLAIR MB, PETERS DW, BEECHEM TE

APPLIED PHYSICS LETTERS

COBALEDA CSF, XIAO XY, BURCKEL DB, POLSKY R, HUANG DN, DIEZ E, PAN W

ACS NANO

BEECHEM TE, OHTA T, DIACONESCU B, ROBINSON JT

ELECTROANALYSIS

XIAO XY, MILLER PR, NARAYAN RJ, BROZIK SM, WHEELER DR, BRENER I, WANG J, BURCKEL DB, POLSKY R

ELECTROANALYSIS

DAVIS DJ, RAJI ARO, LAMBERT TN, VIGIL JA, LI L, NAN KW, TOUR JM