PHYSICAL REVIEW APPLIED
JARZEMBSKI A, GOLDFLAM M, SIDDIQUI A, RUIZ I, BEECHEM TE
APPLIED PHYSICS LETTERS
GOLDFLAM MD, RUIZ I, HOWELL SW, TAUKEPEDRETTI A, ANDERSON EM, WENDT JR, FINNEGAN P, HAWKINS S, COON W, FORTUNE TR, SHANER EA, KADLEC C, OLESBERG JT, KLEM J, WEBSTER PT, SINCLAIR MB, KIM JK, PETERS DW, BEECHEM TE
ACS APPLIED NANO MATERIALS
RUIZ I, BEECHEM TE, SMITH S, DICKENS P, PAISLEY EA, SHANK J, HOWELL SW, SARMA R, DRAPER BL, GOLDFLAM MD
ACS PHOTONICS
LIU PQ, RENO JL, BRENER I
OPTICS EXPRESS
GOLDFLAM MD, RUIZ I, HOWELL SW, WENDT JR, SINCLAIR MB, PETERS DW, BEECHEM TE
APPLIED PHYSICS LETTERS
COBALEDA CSF, XIAO XY, BURCKEL DB, POLSKY R, HUANG DN, DIEZ E, PAN W
ACS NANO
BEECHEM TE, OHTA T, DIACONESCU B, ROBINSON JT
CHEMICAL PHYSICS LETTERS
ALAM TM, PEARCE CJ
ELECTROANALYSIS
XIAO XY, MILLER PR, NARAYAN RJ, BROZIK SM, WHEELER DR, BRENER I, WANG J, BURCKEL DB, POLSKY R
ELECTROANALYSIS
DAVIS DJ, RAJI ARO, LAMBERT TN, VIGIL JA, LI L, NAN KW, TOUR JM