国家/地区 | |
关键词 | |
出版物 | ADVANCED MATERIALS(2) |
出版时间 | 2015(2) |
机构 | |
作者 | CHEN S(2) |
Mapping Local Quantum Capacitance and Charged Impurities in Graphene via Plasmonic Impedance Imaging
ADVANCED MATERIALS
SHAN XN, CHEN S, WANG H, CHEN ZX, GUAN Y, WANG YX, WANG SP, CHEN HY, TAO NJ
ADVANCED MATERIALS
DUAN JJ, CHEN S, CHAMBERS BA, ANDERSSON GG, QIAO SZ