国家/地区 | Sweden(4) Germany(2) |
关键词 |
GRAPHENE(3)
RF(2)
STATISTIC(2)
WAFERSCALE FABRICAT.(2) |
出版物 | IEEE TRANSACTIONS O.(2) |
出版时间 | 2017(6) |
机构 | KTH ROYAL IN.(5) |
作者 | SMITH AD(6) |
Wafer-Scale Statistical Analysis of Graphene FETs-Part I: Wafer-Scale Fabrication and Yield Analysis
IEEE TRANSACTIONS ON ELECTRON DEVICES
SMITH AD, WAGNER S, KATARIA S, MALM BG, LEMME MC, OSTLING M
IEEE TRANSACTIONS ON ELECTRON DEVICES
SMITH AD, WAGNER S, KATARIA S, MALM BG, LEMME MC, OSTLING M
SURFACE SCIENCE
ELGAMMAL K, HUGOSSON HW, SMITH AD, RASANDER M, BERGQVIST L, DELIN A
NANOSCALE
DELEKTA SS, SMITH AD, LI JT, OSTLING M
NANO LETTERS
WAGNER S, DIEING T, CENTENO A, ZURUTUZA A, SMITH AD, OSTLING M, KATARIA S, LEMME MC
RSC ADVANCES
SMITH AD, ELGAMMAL K, FAN XG, LEMME MC, DELIN A, RASANDER M, BERGQVIST L, SCHRODER S, FISCHER AC, NIKLAUS F, OSTLING M