国家/地区 | Sweden(4) |
关键词 |
GRAPHENE(3)
RF(2)
STATISTIC(2)
WAFERSCALE FABRICAT.(2) |
出版物 | IEEE TRANSACTIONS O.(2) |
出版时间 | 2017(4) |
机构 | KTH ROYAL IN.(4) |
作者 | SMITH AD(4) |
Wafer-Scale Statistical Analysis of Graphene FETs-Part I: Wafer-Scale Fabrication and Yield Analysis
IEEE TRANSACTIONS ON ELECTRON DEVICES
SMITH AD, WAGNER S, KATARIA S, MALM BG, LEMME MC, OSTLING M
IEEE TRANSACTIONS ON ELECTRON DEVICES
SMITH AD, WAGNER S, KATARIA S, MALM BG, LEMME MC, OSTLING M
SURFACE SCIENCE
ELGAMMAL K, HUGOSSON HW, SMITH AD, RASANDER M, BERGQVIST L, DELIN A
NANOSCALE
DELEKTA SS, SMITH AD, LI JT, OSTLING M