国家/地区 Italy（2）
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机构 ENEA（2）
作者 RUFOLONI A（2）

Extreme.Ultraviolet Generation-of Localized Defects-in Single-Layer Graphene: Raman Mapping, Atomic Force Microscopy, and High Resolution Scanning EleCtron Microscopy' Analysis

ACS APPLIED ELECTRONIC MATERIALS

BOTTI S, MEZI L, RUFOLONI A, VANNOZZI A, BOLLANTI S, FLORA F

DNA self-assembly on graphene surface studied by SERS mapping

CARBON

BOTTI S, RUFOLONI A, LAURENZI S, GAY S, RINDZEVICIUS T, SCHMIDT MS, SANTONICOLA MG