国家/地区 | Denmark(3) |
关键词 | METROLOGY(4) |
出版物 | |
出版时间 | |
机构 | TECH UNIV DENMARK(4) |
作者 | WHELAN PR(4) |
NANOTECHNOLOGY
MACKENZIE DMA, KALHAUGE KG, WHELAN PR, OSTERGAARD FW, PASTERNAK I, STRUPINSKI W, BOGGILD P, JEPSEN PU, PETERSEN DH
MICROELECTRONIC ENGINEERING
WHELAN PR, ZHAO XJ, PASTERNAK I, STRUPINSKI W, JEPSEN PU, BOGGILD P
ACS APPLIED MATERIALS INTERFACES
WHELAN PR, PANCHAL V, PETERSEN DH, MACKENZIE DMA, MELIOS C, PASTERNAK I, GALLOP J, OSTERBERG FW, JEPSEN PU, STRUPINSKI W, KAZAKOVA O, BOGGILD P
2D MATERIALS
BOGGILD P, MACKENZIE DMA, WHELAN PR, PETERSEN DH, BURON JD, ZURUTUZA A, GALLOP J, HAO L, JEPSEN PU