国家/地区 | Usa(4) |
关键词 | |
出版物 | APPLIED PHYSICS LET.(2) |
出版时间 | |
机构 | UNIV CALIF LOS ANGELES(4) |
作者 | HUANG BC(4) |
MICROELECTRONICS RELIABILITY
WANG YJ, HUANG BC, ZHANG M, WOO JCS
APPLIED PHYSICS LETTERS
HUANG BC, ZHANG M, WANG YJ, WOO J
IEEE TRANSACTIONS ON ELECTRON DEVICES
WANG YJ, MIAO CQ, HUANG BC, ZHU J, LIU W, PARK Y, XIE YH, WOO JCS
APPLIED PHYSICS LETTERS
ZHANG M, HUANG BC, WANG Y, WOO JCS