国家/地区 Poland（3）
关键词 KPFM（3）
出版物
出版时间 2016（2）
机构 WROCLAW UNIV TECHNOL（3）
作者 GAJEWSKI K（3）

Kelvin Probe Force Microscopy investigations of High Strength Metallurgical Graphene transferred on low-density polyethylene

MICROELECTRONIC ENGINEERING

GAJEWSKI K, SZYMANSKI W, NIEDZIELSKI P, GOTSZALK T

Raman Spectroscopy and Kelvin Probe Force Microscopy characteristics of the CVD suspended graphene

DIAMOND RELATED MATERIALS

GAJEWSKI K, GONISZEWSKI S, SZUMSKA A, MOCZALA M, KUNICKI P, GALLOP J, KLEIN N, HAO L, GOTSZALK T

Scanning probe microscopy investigations of the electrical properties of chemical vapor deposited graphene grown on a 6H-SiC substrate

MICRON

GAJEWSKI K, KOPIEC D, MOCZALA M, PIOTROWICZ A, ZIELONY M, WIELGOSZEWSKI G, GORSZALK T, STRUPINSKI W