国家/地区 | Usa(6) |
关键词 | ATOMIC FORCE MICROSCOPY(6) |
出版物 | ACS NANO(6) |
出版时间 | 2010(2) |
机构 | US NAVAL RES.(2) |
作者 | ROBINSON JT(2) SHEEHAN PE(2) |
ACS NANO
TSOI S, DEV P, FRIEDMAN AL, STINE R, ROBINSON JT, REINECKE TL, SHEEHAN PE
ACS NANO
LEE WK, HAYDELL M, ROBINSON JT, LARACUENTE AR, CIMPOIASU E, KING WP, SHEEHAN PE
ACS NANO
SUK JW, PINER RD, AN JH, RUOFF RS
ACS NANO
SINITSKII A, KOSYNKIN DV, DIMIEV A, TOUR JM
ACS NANO
SCHNIEPP HC, KUDIN KN, LI JL, PRUD HOMME RK, CAR R, SAVILLE DA, AKSAY IA
ACS NANO
YE ZJ, EGBERTS P, HAN GH, JOHNSON ATC, CARPICK RW, MARTINI A