国家/地区 Switzerland（2）
关键词
出版物 APPLIED PHYSICS LETTERS（2）
出版时间
机构 UNIV BASEL（2）
作者 STEINER R（2）

Work function of few layer graphene covered nickel thin films measured with Kelvin probe force microscopy

APPLIED PHYSICS LETTERS

EREN B, GYSIN U, MAROT L, GLATZEL T, STEINER R, MEYER E

Spectroscopic ellipsometry on Si/SiO2/graphene tri-layer system exposed to downstream hydrogen plasma: Effects of hydrogenation and chemical sputtering

APPLIED PHYSICS LETTERS

EREN B, FU WY, MAROT L, CALAME M, STEINER R, MEYER E