国家/地区
关键词 RELIABILITY（2）
出版物 IEEE TRANSACTIONS ON ELECTRON DEVICES（2）
出版时间 2015（2）
机构
作者

Hot-Carrier Degradation and Bias-Temperature Instability in Single-Layer Graphene Field-Effect Transistors: Similarities and Differences

IEEE TRANSACTIONS ON ELECTRON DEVICES

ILLARIONOV Y, SMITH A, VAZIRI S, OSTLING M, MUELLER T, LEMME M, GRASSER T

Versatile Compact Model for Graphene FET Targeting Reliability-Aware Circuit Design

IEEE TRANSACTIONS ON ELECTRON DEVICES

MUKHERJEE C, AGUIRREMORALES JD, FREGONESE S, ZIMMER T, MANEUX C