国家/地区
关键词 ATOMIC FORCE MICROSCOPY（2）
出版物 JOURNAL OF MOLECULAR STRUCTURE（2）
出版时间
机构
作者

Raman and ellipsometry spectroscopic analysis of graphene films grown directly on Si substrate via CVD technique for estimating the graphene atomic planes number

JOURNAL OF MOLECULAR STRUCTURE

ALHAZMI FS, BEALL GW, ALGHAMDI AA, ALSHAHRIE A, SHOKR FS, MAHMOUD WE

Effects of morphology and charge transport of PDIF-CN2/graphene TFT

JOURNAL OF MOLECULAR STRUCTURE

MATHEW J, CASSESE D