国家/地区 | |
关键词 | |
出版物 |
MICROELECTRONICS RELIABILITY(4)![]() |
出版时间 |
2018(4)![]() |
机构 | |
作者 |
Infrared response of vanadium oxide (VOx)/SiNx/reduced graphene oxide (rGO) composite microbolometer
MICROELECTRONICS RELIABILITY
WU ZY, TANG SF, ZENG HY, LIN WJ, CHEN TC, GAU YT
MICROELECTRONICS RELIABILITY
BASU J, SAMANTA N, JANA S, ROYCHAUDHURI C
MICROELECTRONICS RELIABILITY
ANTONINI M, COVA P, DELMONTE N, CASTELLAZZI A
MICROELECTRONICS RELIABILITY
ZHANG QW, LI P, LIAO YB, WANG G, ZENG RZ, WANG H